Event Announcements

IMSTW’06 International Mixed-Signals Testing Workshop, 21 - 23 Jun 06, Edinburgh, UK
The IEEE International Mixed-Signals Testing Workshop (IMSTW) is a forum for discussing all aspects of testing,
design-for-test and reliable design of integrated mixed-signals/mixed-technology functions and systems. This
includes testing and design verification of monolithic mixed-signal/mixed-technology systems (SoC),
heterogeneous systems including system-in-package and printed circuit board implementations of mixed signal
functions. The technology spectrum includes analogue, mixed-signals, high-speed IO, RF, MEMS (inc. optics, bio-
chemical and microfluidics), and nanotechnology. Test topics such as design-for-test techniques, BIST, fault
diagnosis, test generation, on-line and off-line testing, fault modelling, fault simulation and design of fault tolerant
systems are all considered. Mixedsignals infrastructure, embedded core testing and application specific topics are
also welcome

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